Seminars Archive

Grazing Incidence X-Ray Fluorescence Analysis: developments and future perspectives

Abstract
Grazing incidence x-ray fluorescence analysis (GIXRF) is a sensitive technique for the analysis of surfaces, near surface layers, thin films and matter deposited on the surface, giving information on the elemental concentrations and distributions. The presentation will start with an historical overview outlining the principles of the technique, its strengths and weaknesses. The combination of the technique with scattering based ones (X-ray reflectivity) and x-ray absorption based ones (XANES, EXAFS) will be discussed. Current research and application of GIXRF to issues related to material science (ultra shallow, doped, semiconductor layers), environmental science (atmospheric particulate matter monitoring), biology (uptake of heavy elements by plants) will be presented showing its capabilities.